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Simulates Multidimensional Adaptive Testing using the multidimensional three-parameter logistic model as described in Segall (1996) <doi:10.1007/BF02294343>, van der Linden (1999) <doi:10.3102/10769986024004398>, Reckase (2009) <doi:10.1007/978-0-387-89976-3>, and Mulder & van der Linden (2009) <doi:10.1007/s11336-008-9097-5>.
Package details |
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Author | Seung W. Choi and David R. King |
Maintainer | Seung W. Choi <schoi@austin.utexas.edu> |
License | GPL (>= 2.10) |
Version | 2.3.1 |
Package repository | View on CRAN |
Installation |
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