Reads x-ray diffraction and reflectivity data in various common file formats. It assists with peak analysis and fitting peak position and width to determine crystal size or thin film thickness.
Package details |
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Maintainer | Thomas Gredig <tgredig@csulb.edu> |
License | GPL (>= 3) |
Version | 0.4.0 |
URL | https://github.com/thomasgredig/rigakuXRD |
Package repository | View on GitHub |
Installation |
Install the latest version of this package by entering the following in R:
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