ATmet: Advanced Tools for Metrology

A collection of functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.

Package details

AuthorSeverine Demeyer and Alexandre Allard, with contributions from Bertrand Iooss
MaintainerAlexandre Allard <>
Package repositoryView on CRAN
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ATmet documentation built on July 8, 2020, 5:55 p.m.