ATmet: Advanced Tools for Metrology

This package provides functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.

Package details

AuthorS.Demeyer, A.Allard
MaintainerAlexandre Allard <[email protected]>
Package repositoryView on CRAN
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ATmet documentation built on May 2, 2019, 12:47 p.m.