BayesGOF: Bayesian Modeling via Frequentist Goodness-of-Fit

A Bayesian data modeling scheme that performs four interconnected tasks: (i) characterizes the uncertainty of the elicited parametric prior; (ii) provides exploratory diagnostic for checking prior-data conflict; (iii) computes the final statistical prior density estimate; and (iv) executes macro- and micro-inference. Primary reference is Mukhopadhyay, S. and Fletcher, D. 2018 paper "Generalized Empirical Bayes via Frequentist Goodness of Fit" (< >).

Package details

AuthorSubhadeep Mukhopadhyay, Douglas Fletcher
MaintainerDoug Fletcher <>
Package repositoryView on CRAN
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BayesGOF documentation built on May 2, 2019, 8:57 a.m.