electronicf: Time to failure of an electronic component

In DataSetsUni: A Collection of Univariate Data Sets

Time to failure of an electronic component

Description

The function allows to provide the time to failure in hours of an electronic component subjected to an accelerated life test.

Usage

data_electronicf

Arguments

data_electronicf

A vector of (non-negative integer) values.

Details

The data represent the time to failure in hours of an electronic component subjected to an accelerated life test. Recently, it is used by Tripathi. (2021) and fitted the inverse log-logistic distribution.

Value

data_electronicf gives the time to failure in hours of an electronic component.

Author(s)

Muhammad Imran.

R implementation and documentation: Muhammad Imran [e-mail].

References

Tripathi, H., Dey, S., & Saha, M. (2021). Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution. Journal of Applied Statistics, 48(7), 1227-1242.

Montgomery, D. C. (2010). Managing, controlling, and improving quality. Wiley Global Education.

See Also

data_failureairc, data_windshieldf, data_breakdown

Examples

x<-data_electronicf
summary(x)

DataSetsUni documentation built on May 31, 2023, 9:15 p.m.