Dpit: Distribution Pitting

Compares distributions with one another in terms of their fit to each sample in a dataset that contains multiple samples, as described in Joo, Aguinis, and Bradley (in press). Users can examine the fit of seven distributions per sample: pure power law, lognormal, exponential, power law with an exponential cutoff, normal, Poisson, and Weibull. Automation features allow the user to compare all distributions for all samples with a single command line, which creates a separate row containing results for each sample until the entire dataset has been analyzed.

Package details

AuthorHarry Joo [aut, cre], Herman Aguinis [aut, dtc], Kyle J. Bradley [aut], Takuya Noguchi [ctb]
MaintainerHarry Joo <harryjoo19@gmail.com>
LicenseGPL (>= 2)
Package repositoryView on CRAN
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Dpit documentation built on May 2, 2019, 2:37 a.m.