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EDFtest: Goodness of Fit Based on Empirical Distribution Function
This repository contains software for the calculation of goodness-of-fit test statistics and their P-values. The three statistics computed are the Empirical Distribution function statistics called Cramer-von Mises, Anderson-Darling, and Watson statistics. The statistics and their P-values can be used to assess an assumed distribution.The following distributions are available: Uniform, Normal, Gamma, Logistic, Laplace, Weibull, Extreme Value, and Exponential.
Getting started
Browse package contents
Package details |
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| Author | Li Yao [aut, cre], Richard Lockhart [aut] |
| Maintainer | Li Yao <yaoliy@sfu.ca> |
| License | MIT + file LICENSE |
| Version | 0.1.0 |
| Package repository | View on CRAN |
| Installation |
Install the latest version of this package by entering the following in R:
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