laser: GaAs Laser Degradation Dataset

In IGPFrailty: Inverse Gaussian Process Degradation Models with Frailty

GaAs Laser Degradation Dataset

Description

Repeated-measures degradation data on 15 Gallium Arsenide (GaAs) laser devices tested at 80 degrees Celsius over 4,000 hours of operation with 16 equidistant inspection intervals.

Usage

laser

Format

A data frame with 255 rows and 5 variables:

unit

Integer unit identifier (1 to 15).

unit_id

Original unit ID code (101 to 115).

hours

Inspection time in hours (0, 250, 500, ..., 4000).

t

Inspection time in thousands of hours (0.0 to 4.0).

increase

Percentage increase in operating current (%), with failure defined at 10%.

Source

Meeker, W. Q., & Escobar, L. A. (1998). Statistical Methods for Reliability Data. John Wiley & Sons.

Morita, L. H. M., Tomazella, V. L. D., Balakrishnan, N., Ramos, P. L., Ferreira, P. H., & Louzada, F. (2021). Inverse Gaussian process model with frailty term in reliability analysis. Quality and Reliability Engineering International, 37(2), 763-784. \Sexpr[results=rd]{tools:::Rd_expr_doi("10.1002/qre.2762")}.

Examples

data(laser)
head(laser)

IGPFrailty documentation built on Aug. 25, 2026, 9:08 a.m.