An adaptation of Kernelized Stein Discrepancy, this package provides a goodness-of-fit test of whether a given i.i.d. sample is drawn from a given distribution. It works for any distribution once its score function (the derivative of log-density) can be provided. This method is based on "A Kernelized Stein Discrepancy for Goodness-of-fit Tests and Model Evaluation" by Liu, Lee, and Jordan, available at
|Author||Min Hyung Kang [aut, cre], Qiang Liu [aut]|
|Date of publication||2016-07-31 08:53:50|
|Maintainer||Min Hyung Kang <[email protected]>|
|License||MIT + file LICENSE|
|Package repository||View on CRAN|
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