planLTPD | R Documentation |
Calculation of LTPD plan (sample size n and critical value k) for sampling inspection by variables
planLTPD(N, pt, pbar, b = 0.1, cm = 1,method = c("exact", "napprox","ewma2","ewmaSK" ), intdif = 20,lam=1)
N |
lot size (number of items in the lot) |
pt |
lot tolerance fraction defective |
pbar |
process average fraction defective |
b |
probability of accepting a lot of tolerance quality |
cm |
parameter used in cost function of plans (see |
method |
type of |
intdif |
parameter used in finding n when |
lam |
smoothing parameter in case that EWMA statistic is used |
An instance of ACSPlan-class
, with sample size in slot n
and critical value in slot k
.
Klufa, J.: Exact calculation of the Dodge-Romig LTPD single sampling plans for inspection by variables. Statistical Papers, Springer, Vol. 51(2), pages 297-305, 2010.
LTPDvar-package
, OC
, ACSPlan-class
, Ims
# find LTPD plan planLTPD(N=1000,pt=0.1,pbar=0.001); planLTPD(1000, 0.01,0.001,cm=1.5,b=0.1,method="ewmaSK",lam=0.9,intdif=60); planLTPD(1000, 0.01,0.001,cm=1.5,b=0.1,method="ewma2",lam=0.9);
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