PatternClass: Class-Focused Pattern Metric Comparisons using Simulation
Version 1.7.1

Provides tools for estimating composition and configuration parameters from a categorical (binary) landscape map (grid) and then simulates a selected number of statistically similar landscapes. Class-focused pattern metrics are computed for each simulated map to produce empirical distributions against which statistical comparisons can be made. The code permits the analysis of single maps or pairs of maps.

Package details

AuthorTarmo K. Remmel, (Marie-Josee Fortin, Ferenc Csillag, Sandor Kabos)
Date of publication2016-10-28 10:04:33
MaintainerTarmo K. Remmel <remmelt@yorku.ca>
LicenseGPL (>= 3)
Version1.7.1
Package repositoryView on CRAN
Installation Install the latest version of this package by entering the following in R:
install.packages("PatternClass")

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PatternClass documentation built on May 29, 2017, 11:26 a.m.