SiRstv: NIST SiRstv Data
In RbyExample: Data for the Book "R by Example"
SiRstv R Documentation
NIST SiRstv Data
Description
Measurements of bulk resistivity of silicon wafers made at NIST with 5
probing instruments on each of 5 days.
Usage
SiRstv
Format
25 obs. of 2 variables:
- Instrument
replicate
- Resistance
resistance
Details
https://www.itl.nist.gov/div898/strd/anova/SiRstv_info.html
Source
https://www.itl.nist.gov/div898/strd/anova/SiRstv.html
References
NIST Standard Reference Datasets: https://www.itl.nist.gov/div898/strd/index.html
RbyExample documentation built on May 29, 2024, 5:50 a.m.
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| SiRstv | R Documentation |
NIST SiRstv Data
Description
Measurements of bulk resistivity of silicon wafers made at NIST with 5 probing instruments on each of 5 days.
Usage
SiRstv
Format
25 obs. of 2 variables:
- Instrument
replicate
- Resistance
resistance
Details
https://www.itl.nist.gov/div898/strd/anova/SiRstv_info.html
Source
https://www.itl.nist.gov/div898/strd/anova/SiRstv.html
References
NIST Standard Reference Datasets: https://www.itl.nist.gov/div898/strd/index.html
R Package Documentation
Browse R Packages
We want your feedback!
Note that we can't provide technical support on individual packages. You should contact the package authors for that.
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