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TestDesign: Optimal Test Design Approach to Fixed and Adaptive Test Construction
Uses the optimal test design approach by Birnbaum (1968, ISBN:9781593119348) and van der Linden (2018) <doi:10.1201/9781315117430> to construct fixed, adaptive, and parallel tests. Supports the following mixed-integer programming (MIP) solver packages: 'Rsymphony', 'highs', 'gurobi', 'lpSolve', and 'Rglpk'. The 'gurobi' package is not available from CRAN; see <https://www.gurobi.com/downloads/>.
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Package details |
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| Author | Seung W. Choi [aut, cre] (<https://orcid.org/0000-0003-4777-5420>), Sangdon Lim [aut] (<https://orcid.org/0000-0002-2988-014X>) |
| Maintainer | Seung W. Choi <schoi@austin.utexas.edu> |
| License | GPL (>= 2) |
| Version | 1.7.0 |
| URL | https://choi-phd.github.io/TestDesign/ (documentation) |
| Package repository | View on CRAN |
| Installation |
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