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Set of functions for analyzing Atomic Force Microscope (AFM) forcedistance curves. It allows to obtain the contact and unbinding points, perform the baseline correction, estimate the Young's modulus, fit up to two exponential decay function to a stressrelaxation / creep experiment, obtain adhesion energies. These operations can be done either over a single Fd curve or over a set of Fd curves in batch mode.
Package details 


Author  Rafael Benitez <[email protected]>, Vicente Jose Bolos, JoseLuis TocaHerrera 
Maintainer  Rafael Benitez <[email protected]> 
License  GPL 
Version  0.0.1 
Package repository  View on CRAN 
Installation 
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