Set of functions for analyzing Atomic Force Microscope (AFM) force-distance curves. It allows to obtain the contact and unbinding points, perform the baseline correction, estimate the Young's modulus, fit up to two exponential decay function to a stress-relaxation / creep experiment, obtain adhesion energies. These operations can be done either over a single F-d curve or over a set of F-d curves in batch mode.
|Author||Rafael Benitez <[email protected]>, Vicente Jose Bolos, Jose-Luis Toca-Herrera|
|Maintainer||Rafael Benitez <[email protected]>|
|Package repository||View on CRAN|
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