synthetic_corruption_plan: Define synthetic measurement corruptions for stress testing

In eyeprocess: Harmonize Eye-Tracking, Pupillometry, Biometrics, and Psychometric Process Data

Define synthetic measurement corruptions for stress testing

Description

Define synthetic measurement corruptions for stress testing

Usage

synthetic_corruption_plan(
  missingness = 0,
  pupil_dropout = 0,
  gaze_offset_x = 0,
  gaze_offset_y = 0,
  sampling_jitter_sd = 0,
  aoi_label_noise = 0,
  device_shift = 0,
  trial_drop = 0,
  seed = 1L
)

Arguments

missingness	Generic missingness proportion.
pupil_dropout	Pupil dropout proportion.
gaze_offset_x, gaze_offset_y	Additive gaze-coordinate offsets.
sampling_jitter_sd	Timestamp jitter SD in timestamp units.
aoi_label_noise	Proportion of AOI labels randomly reassigned.
device_shift	Additive shift for a declared device-sensitive numeric column.
trial_drop	Proportion of rows/trials removed.
seed	Seed.

Value

An object of class "eye_synthetic_corruption_plan", stored as a named list, with components "missingness", "pupil_dropout", "gaze_offset_x", "gaze_offset_y", "sampling_jitter_sd", "aoi_label_noise", "device_shift", "trial_drop", "seed", "status". It contains define synthetic measurement corruptions for stress testing and associated metadata or diagnostics needed to interpret the result.

eyeprocess documentation built on Sept. 28, 2026, 5:08 p.m.