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mmpp: Various Similarity and Distance Metrics for Marked Point Processes
Compute similarities and distances between marked point processes.
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Package details |
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| Author | Hideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata |
| Maintainer | Hideitsu Hino <hinohide@cs.tsukuba.ac.jp> |
| License | GPL-2 |
| Version | 0.6 |
| Package repository | View on CRAN |
| Installation |
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