mmpp: Various Similarity and Distance Metrics for Marked Point Processes

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Compute similarities and distances between marked point processes.

Author
Hideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata
Date of publication
2015-08-20 11:59:40
Maintainer
Hideitsu Hino <hinohide@cs.tsukuba.ac.jp>
License
GPL-2
Version
0.4

View on CRAN

Man pages

coocmetric
Metrics for Point Process Realizations Based on Co-occurrence
fmetric
Compute Filter-based Metrics in a Functional Space Between...
ieimetric
Compute Inter Event Interval-based Metric Between Marked...
iipmetric
Compute Intensity Inner Product Metrics
k2d
Convert Kernel Matrix to Distance Matrix
Miyagi20030626
The aftershock data of 26th July 2003 earthquake of M6.2 at...
mmpp-package
A package for Computing Similarity and Distance Metrics for...
splitMPP
Split MPP Data by Sliding Time Window

Files in this package

mmpp
mmpp/NAMESPACE
mmpp/NEWS
mmpp/data
mmpp/data/Miyagi20030626.RData
mmpp/R
mmpp/R/mmpp.r
mmpp/R/ieimetric.r
mmpp/R/coocmetric.r
mmpp/R/iipmetric.r
mmpp/R/utils.r
mmpp/R/splitData.r
mmpp/R/fmetric.r
mmpp/R/k2d.r
mmpp/MD5
mmpp/DESCRIPTION
mmpp/man
mmpp/man/splitMPP.Rd
mmpp/man/ieimetric.Rd
mmpp/man/coocmetric.Rd
mmpp/man/fmetric.Rd
mmpp/man/k2d.Rd
mmpp/man/iipmetric.Rd
mmpp/man/Miyagi20030626.Rd
mmpp/man/mmpp-package.Rd