mmpp: Various Similarity and Distance Metrics for Marked Point Processes

Compute similarities and distances between marked point processes.

Package details

AuthorHideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata
MaintainerHideitsu Hino <>
Package repositoryView on CRAN
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mmpp documentation built on May 1, 2019, 7:59 p.m.