mmpp: Various Similarity and Distance Metrics for Marked Point Processes

Compute similarities and distances between marked point processes.

AuthorHideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata
Date of publication2015-08-20 11:59:40
MaintainerHideitsu Hino <hinohide@cs.tsukuba.ac.jp>
LicenseGPL-2
Version0.4

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Files

mmpp
mmpp/NAMESPACE
mmpp/NEWS
mmpp/data
mmpp/data/Miyagi20030626.RData
mmpp/R
mmpp/R/mmpp.r
mmpp/R/ieimetric.r
mmpp/R/coocmetric.r
mmpp/R/iipmetric.r
mmpp/R/utils.r
mmpp/R/splitData.r
mmpp/R/fmetric.r
mmpp/R/k2d.r
mmpp/MD5
mmpp/DESCRIPTION
mmpp/man
mmpp/man/splitMPP.Rd mmpp/man/ieimetric.Rd mmpp/man/coocmetric.Rd mmpp/man/fmetric.Rd mmpp/man/k2d.Rd mmpp/man/iipmetric.Rd mmpp/man/Miyagi20030626.Rd mmpp/man/mmpp-package.Rd

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