selectspm: Select Point Pattern Models Based on Minimum Contrast, AIC and Goodness of Fit

Fit and selects point pattern models based on minimum contrast, AIC and and goodness of fit.

AuthorMarcelino de la Cruz
Date of publication2015-07-10 20:41:40
MaintainerMarcelino de la Cruz <marcelino.delacruz@urjc.es>
LicenseGPL (>= 2)
Version0.2

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