The cumulative sum (CUSUM) control chart is considered to be an alternative or complementary to Shewhart control charts in statistical process control (SPC) applications, owing to its higher sensitivity to small shifts in the process mean. It utilizes all the available data rather than the last few ones used in Shewhart control charts for quick decision making. Vmask is a traditional technique for separating meaningful data from unusual circumstances in a Cumulative Sum (CUSUM) control chart; for see details about vmask see Montgomery (1985, ISBN:9780471656319). The mask is a Vshaped overlay placed on the CUSUM chart so that one arm of the V lines up with the slope of data points, making it easy to see data points that lie outside the slope and to determine whether these points should be discarded as random events, or treated as a performance trend that should be addressed. But, complex computations is one disadvantage Vmask method for detect small changes in mean using CUSUM control chart. Package 'vMask' can help to the applied users to overcome this challenge by considering six different methods which each of them are based on different information.
Package details 


Author  Abbas Parchami (Department of Statistics, Faculty of Mathematics and Computer, Shahid Bahonar University of Kerman, Kerman, Iran) 
Maintainer  Abbas Parchami <parchami@uk.ac.ir> 
License  LGPL (>= 3) 
Version  1.0 
Package repository  View on CRAN 
Installation 
Install the latest version of this package by entering the following in R:

Any scripts or data that you put into this service are public.
Add the following code to your website.
For more information on customizing the embed code, read Embedding Snippets.