Hooper and Amster (1990) analyze the temperature-accelerated life test data on an unidentified device. Meeker and Escobar (1998) refer to this device as "Device A". The purpose of the experiment was to determine if "Device A" would meet a failure rate objective through 10,000 hours and 30,000 hours at an operating ambient temperature of 10 degrees celsius. Device samples were tested for up to 5000 hours at four separate temperatures.
A data.frame
with 37 rows and 4 variables:
[, 1] | hours | Accumulated time at event | Numeric |
[, 2] | event | Event observed at hours (failure/right-censored) | Categoric |
[, 3] | count | Number of events observed at hours | Numeric |
[, 4] | celsius | Temperature applied to the device during testing | Numeric |
Hoopers J. H. and Amster, S. J. (1990) Analysis and presentation of reliability data, in Handbook of Statistical Methods for Engineers and Scientists, McGraw-Hill, New York. Harrison M. Wadsworth, Editor.
Meeker W.Q. and Escobar L.A. (1998) Statistical Methods for Reliability Data, New York: John Wiley & Sons.
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