deviceb: Power output degradation in integrated circuit devices

In Auburngrads/SMRD: Statistical Methods For Reliability Data

Description

Samples of integrated circuit devices called "Device B" were tested at each of three levels of junction temperature. The purpose of the test was to provide design engineers with an assessment of the proportion of these devices that would "fail" before 15 years (about 130 thousand hours) of operation at 80 degrees celsius. Failure for an individual device was defined as when the measured power output dropped more than 0.5 decibels (dB) below initial output. At standard the operating temperature (80 degrees celsius), the devices will degrade too slowly to provide useful information in 6 months. Because units at low temperature degrade more slowly, they had to be run for longer periods of time to accumulate appreciable degradation. Because of severe limitations in the number of test positions, fewer units were run at lower temperatures.

Note: The original data from this experiment are proprietary. The observations in this dataset were actually simulated from a model suggested by physical theory and limited real data that was available at the time when the more complete experiment was being planned.

Format

A data.frame with 570 rows and 4 variables:

[, 1]	powerdrop	Degradation (measured in decibels dB) of a device under test	Numeric
[, 2]	device	Label for the device under test	Categoric
[, 3]	hours	Time at which the degradation measure was observed	Numeric
[, 4]	celsius	Temperature applied	Numeric

Source

Meeker W.Q. and Escobar L.A. (1998) Statistical Methods for Reliability Data, New York: John Wiley & Sons.

Auburngrads/SMRD documentation built on Sept. 14, 2020, 2:21 a.m.