devicec: Integrated circuit accelerated life test data

In Auburngrads/SMRD: Statistical Methods For Reliability Data

Description

Observations from an accelerated life test performed on an integrated circuit device called "Device C". Failures were caused by a chemical reaction inside the circuit package. Reliability engineers tested 10 circuits at five different temperatures over a period of 3000 hours. The purpose of the experiment was to estimate the activation energy of the failure-causing reaction and to obtain an estimate of the integrated circuit life distribution at an 80 degrees celsius junction temperature.

Format

A data.frame with 26 rows and 4 variables:

[, 1]	celsius	Temperature to which a device was exposed during the test	Numeric
[, 2]	kilohours	Accumulated time at event	Numeric
[, 3]	event	Event observed at hours (failure/right-censored)	Categoric
[, 4]	count	Number of events observed at hours	Numeric

Source

Meeker W.Q. and Escobar L.A. (1998) Statistical Methods for Reliability Data, New York, NY; John Wiley & Sons.

Auburngrads/SMRD documentation built on Sept. 14, 2020, 2:21 a.m.