deviceg: Field tracking study with multiple failure modes

In Auburngrads/SMRD: Statistical Methods For Reliability Data

Description

Thirty (30) samples of a device that was part of a power generation system were tested as part of a field tracking study for up to 300 kilocycles. The devices under test were installed in typical service environments and at the occurence of a failure, the observed number of cycles and the type of failure were recorded. Surge failures, which predominated early in the device life-cycle, were caused by an accumulation of randomly occurring damage from power-line voltage spikes during electric storms resulting in failure of a particular unprotected electronic component. Wearout failures resulted from normal product wear and began to appear after 100 thousand cycles of use.

Format

A data.frame with 30 rows and 2 variables:

[, 1]	kilocycles	Accumulated cycles at failure (in thousands)	Numeric
[, 2]	mode	Failure mode observed at kcycles (Wearout/Surge/Suspension)	Categoric

Source

Meeker W.Q. and Escobar L.A. (1998) Statistical Methods for Reliability Data, New York, NY; John Wiley & Sons.

Auburngrads/SMRD documentation built on Sept. 14, 2020, 2:21 a.m.