tantalum: Electrolytic capacitor accelerated life test data

In Auburngrads/SMRD: Statistical Methods For Reliability Data

Description

Singpurwalla, Castellino, and Goldschen (1975) present temperature/voltage accelerated life test data on tantalum electrolytic capacitors. The tests were conducted at temperature/voltage combinations that were nonrectangular and with unequal allocations of units.

Format

A data.frame with 48 rows and 5 variables:

[, 1]	hours	Accumulated time at event	Numeric
[, 2]	event	Event observed at hours (failure/right-censored)	Categoric
[, 3]	count	Number of events observed at hours	Numeric
[, 4]	volts	Voltage applied to the unit	Numeric
[, 5]	celsius	Temperature applied to the unit	Numeric

Source

Singpurwalla, N. D., Castellino, V. C., and Goldschen, D. Y. (1975), Inference from accelerated life tests using Eyring type re-parameterizations, Naval Research Logistics Quarterly, 22, 289-296.

Auburngrads/SMRD documentation built on Sept. 14, 2020, 2:21 a.m.