XPSDepthProfile: XPSDepthProfile reconstruction of Depth Profiles

In GSperanza/RxpsG_2.3-1: Processing Tool for X-ray Photoelectron Spectroscopy Data

XPSDepthProfile reconstruction of Depth Profiles

Description

XPSDepthProfile function is used to manipulate single or multiple XPS-Samples acquired by varying the tilt angle (ARXPS) or after sputter-etch cycles (sputter-depth-profiles) The function loads the spectra at variopus angles or at various sputter-cycles defines the Baselines and computes the element quantification. Results are automatically plotted as a function of the tilt angle or of the etch cycles

Usage

XPSDepthProfile()

Examples

## Not run: 
	XPSDepthProfile()

## End(Not run)

GSperanza/RxpsG_2.3-1 documentation built on Feb. 11, 2024, 5:09 p.m.