Retrieve i facility details data from ghg database
1 2 3 4 5 6 7 8 9 10 | ghg_i_facility_details(FACILITY_ID = NULL, REPORTING_YEAR = NULL,
FAC_MAN_GREA_THAN_300ML_WAFERS = NULL,
FAC_MANUFACTURE_300ML_WAFERS = NULL,
FAC_MANUFACTURE_200ML_WAFERS = NULL,
FAC_MANUFACTURE_150ML_WAFERS = NULL,
FAC_MANUFACTURE_MEMS_PVS_LCDS = NULL,
FAC_MANUFACTURE_SEMICONDUCTORS = NULL, FACILITY_NAME = NULL,
APPORTIONING_MODEL_COMPARISON = NULL, VERIFICATION_START_DATE = NULL,
VERIFICATION_END_DATE = NULL, CERT_OF_GASES_SELECTED = NULL,
FAC_MAN_LESS_THAN_150ML_WAFERS = NULL)
|
FACILITY_ID |
e.g. '1000354'. See Details. |
REPORTING_YEAR |
e.g. '2012'. See Details. |
FAC_MAN_GREA_THAN_300ML_WAFERS |
e.g. 'NO'. See Details. |
FAC_MANUFACTURE_300ML_WAFERS |
e.g. 'NO'. See Details. |
FAC_MANUFACTURE_200ML_WAFERS |
e.g. 'YES'. See Details. |
FAC_MANUFACTURE_150ML_WAFERS |
e.g. 'NO'. See Details. |
FAC_MANUFACTURE_MEMS_PVS_LCDS |
e.g. 'NO'. See Details. |
FAC_MANUFACTURE_SEMICONDUCTORS |
e.g. 'YES'. See Details. |
FACILITY_NAME |
e.g. 'CYPRESS SEMICONDUCTOR MINNESOTA INC'. See Details. |
APPORTIONING_MODEL_COMPARISON |
e.g. '0.2'. See Details. |
VERIFICATION_START_DATE |
e.g. '01-JAN-12'. See Details. |
VERIFICATION_END_DATE |
e.g. '31-DEC-12'. See Details. |
CERT_OF_GASES_SELECTED |
e.g. 'CERTIFIED'. See Details. |
FAC_MAN_LESS_THAN_150ML_WAFERS |
e.g. 'NA'. See Details. |
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