STAT210prob2.29 | R Documentation |
This data is from an article in Solid State Technology (May 1987)
which describes an experiment to determine the effect of the
C_{2}
F_{6}
flow rate on the uniformity of the etch on a silicon
wafer used in integrated circuit manufacturing. All the runs were made in
random order, and the data are the uniformity observations of the two flow
rates.
STAT210prob2.29
A data frame with 12 observations (rows) and 2 variables (columns).
Column name | Data type | Description | Values | |
[,1] | FlowRate | integer | 2 different C_{2} F_{6} flow rates | (125 - 200) |
[,2] | Uniformity | numeric | The observed uniformity | (2.6 - 5.1) |
This is data from Exercise 2.29 in Design and Analysis of Experiments, 9th Edition, EMEA Edition.
Montgomery, D. C. (2019) Design and Analysis of Experiments, 9th Edition, EMEA Edition. New York: Wiley.
Yin, G.Z. and Jillie, D.W. (1987) Orthogonal Design for Process Optimization and Its Application to Plasma Etching. Solid State Technology.
STAT210example3.1
, STAT210prob2.31
, STAT210prob2.33
, and STAT210prob2.39
# A short summary of the variables
summary(STAT210prob2.29)
# Uniformity for different flow rates of Hexafluoroethane
boxplot(Uniformity ~ FlowRate, data = STAT210prob2.29,
col = "steelblue2")
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