MeekerData: Generate example data tables as presented in "Statistical...

In WeibullR.ALT: Accelerated Life Testing Using 'WeibullR'

Generate example data tables as presented in "Statistical Methods for Reliability Data" by Bill Meeker and Luis Escobar

Description

This function generates life test data tables suitable for use in example scripts.

Usage

	MeekerData(x)

Arguments

x	Either a character string ending with "3", "10", "13", "15" or "16" or a numeric of the table digits. In the book these tables were all prefixed with a "C."

Details

Table C.3 Presents degeneration data on some carbon-film resistors.

Table C.10 "Temperature-Accelerated Life Test Data for Device-A". This data is used for the first (perhaps simplest) example of the analysis steps for accelerated test data. Pages 494-500 in Meeker text.

Table C.13 "Minutes to Failure of Mylar-Polyurethane Laminated DC HV Insulating Structure. This data is exampled by Meeker on pages 504-507. It is also discussed in earlier chapters.

Table C.15 "Accelerated Life Test Data on a New-Technology Integrated Circuit Device". This data is exampled by Meeker on pages 508-511.

Table C.16 "Temperature and Voltage-Accelerated Life Test Data for Tantalum Electrolytic Capacitors". This data is the basis for multiple variable acceleration exampled by Meeker on pages 513-515.

Value

The returned object is either a dataframe or a list that can be accessed by the names of the olumns or elments.

References

William Q. Meeker and Luis A. Escobar, (1998) "Statistical Methods for Reliability Data", Wiley-Interscience, New York

Examples

  t10<-MeekerData("C.10")

WeibullR.ALT documentation built on June 28, 2022, 3 a.m.