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AFM: Atomic Force Microscope Image Analysis
Provides Atomic Force Microscope images analysis such as Gaussian mixes identification, Power Spectral Density, roughness against lengthscale, experimental variogram and variogram models, fractal dimension and scale, 2D network analysis. The AFM images can be exported to STL format for 3D printing.
Getting started
Browse package contents
Package details |
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| Author | Mathieu Beauvais [aut, cre], Irma Liascukiene [aut], Jessem Landoulsi [aut] |
| Maintainer | Mathieu Beauvais <beauvais.escp@gmail.com> |
| License | AGPL-3 |
| Version | 2.0 |
| Package repository | View on CRAN |
| Installation |
Install the latest version of this package by entering the following in R:
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