# GoF tests based on the Laplace transform, the mean residual life and the integrated distribution function for the Exponential distribution

### Description

Computes the Weibull GoF tests based on the Laplace transform: Baringhaus-Henze (BH) and Henze (He). The test statistic of Klar (Kl) is based on the integrated distribution function. Two tests are based on the mean residual life (BHC, BHK).

### Usage

1 |

### Arguments

`x` |
a numeric vector of data values. |

`type` |
the type of the test statistic used. "BH" is the default used test of Baringhaus-Henze,"He" for Henze, "Kl" for Klar, "BHC" and "BHK" for the tests based on the integrated distribution function. |

`a` |
parameter value to be adjusted for the test statistics. |

`nsim` |
an integer specifying the number of replicates used in Monte Carlo. |

### Value

An object of class htest.

### Author(s)

Meryam KRIT

### References

Baringhaus L. and Henze N., Tests of fit for exponentiality based on a characterization via the mean residual life function, *Statistical Papers*, 41, 225-236, 2000.

Baringhaus L. and Henze N., A class of consistent tests for exponentiality based on the empirical Laplace transform, *Annals of the Institute of Statistical Mathematics*, 43, 551-564, 1991.

Henze N., A new flexible class of omnibus tests for exponentiality, *Communications in Statistics, Theory and Methods*, 22, 115-133, 1993.

Klar B., Goodness-of-fit tests for the exponential and normal distribution based on the integrated distribution function, *Annals of the Institute of Statistical Mathematics*, 53, 338-353, 2001.

### Examples

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