break.data: Sample recording of SICM pipette breakage

Description Usage Format Source Examples

Description

Position and current data recorded using a scanning ion conductance microscope in hopping mode. An elevated fall rate drove the pipette to overshoot its detection range and collide with the cover slip surface and break, altering its resistance.

Usage

1

Format

A data frame with 9999 observations on the following 3 variables.

s

The time of each data point, in milliseconds from the start of the recording.

pA

The ion current passing through the pipette, in picoamps.

Z

The pipette position, in microns, recorded within the frame of reference of the SICM piezo actuator.

Source

Caldwell, M., Del Linz, S. J. L., Smart, T. G. S. and Moss, G. W. J. 2012 Method for estimating the tip geometry of scanning ion conductance microscope pipets. Anal. Chem. (in press)

Examples

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breakage documentation built on May 1, 2019, 11:30 p.m.