Functions to estimate the interior half-cone angle and tip radius of a scanning ion conductance microscope (SICM) pipette by fitting recorded changes in pipette conductance as the pipette tip is broken. See the referenced paper for a full discussion of this technique.
Matthew Caldwell <email@example.com>
Caldwell, M., Del Linz, S. J. L., Smart, T. G. S. and Moss, G. W. J. 2012 Method for estimating the tip geometry of scanning ion conductance microscope pipets. Anal. Chem. 84(21):8980–8984
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