Fits standard and random effects latent class models. The single level random effects model is described in Qu et al <doi:10.2307/2533043> and the two level random effects model in Beath and Heller <doi:10.1177/1471082X0800900302>. Examples are given for their use in diagnostic testing.
|Author||Ken Beath [aut, cre]|
|Maintainer||Ken Beath <[email protected]>|
|License||GPL (>= 2)|
|Package repository||View on CRAN|
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