rellipsoid_dev: Sample points uniformly on the surface of an ellipsoid, 2D or...
In antiphon/Kdirectional: Analysis of anisotropy in point patterns using second order statistics

rellipsoid_dev

R Documentation

Sample points uniformly on the surface of an ellipsoid, 2D or 3D

Sample points uniformly on the surface of an ellipsoid, 2D or 3D

rellipsoid_dev(
  n,
  axes = c(1, 1, 1),
  noise.sd = 0,
  R = NULL,
  method = 1,
  rej = FALSE
)

`axes`	vector giving the semi-axis lengths
`noise.sd`	noise
`R`	rotation matrix

antiphon/Kdirectional documentation built on Feb. 13, 2023, 6:26 a.m.

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