ads: Spatial point patterns analysis

Perform first- and second-order multi-scale analyses derived from Ripley K-function, for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with tests of statistical significance based on Monte Carlo simulations.

AuthorR. Pelissier and F. Goreaud
Date of publication2015-01-13 14:49:23
MaintainerRaphael Pelissier <Raphael.Pelissier@ird.fr>
LicenseGPL-2
Version1.5-2.2

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