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ads: Spatial Point Patterns Analysis
Perform first- and second-order multi-scale analyses derived from Ripley K-function, for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with tests of statistical significance based on Monte Carlo simulations.
Getting started
Browse package contents
Package details |
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| Author | Raphael Pelissier [aut], Francois Goreau [aut], Philippe Verley [ctb, cre] |
| Maintainer | Philippe Verley <[email protected]> |
| License | GPL-2 |
| Version | 1.5-3 |
| Package repository | View on CRAN |
| Installation |
Install the latest version of this package by entering the following in R:
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