Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) <doi:10.1214/08-AOAS181>.
|Author||P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister|
|Maintainer||T. Mildenberger <[email protected]>|
|License||GPL (>= 2)|
|Package repository||View on CRAN|
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