diffractometry: Baseline identification and peak decomposition for x-ray diffractograms

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).

AuthorP.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Date of publication2013-12-11 17:15:58
MaintainerT. Mildenberger <mild@zhaw.ch>
LicenseGPL (>= 2)
Version0.1-8

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Files in this package

diffractometry
diffractometry/src
diffractometry/src/Cbaselinefit.c
diffractometry/src/MaxSubsequenceMod.cpp
diffractometry/src/Fbaselinefit.f
diffractometry/src/p7fit.c
diffractometry/NAMESPACE
diffractometry/data
diffractometry/data/indiumoxide.rda
diffractometry/R
diffractometry/R/sysdata.rda
diffractometry/R/baselinefit.r
diffractometry/R/diffractogram.r
diffractometry/R/fitint.r
diffractometry/MD5
diffractometry/DESCRIPTION
diffractometry/man
diffractometry/man/pkdecomp.Rd diffractometry/man/baselinefit.Rd diffractometry/man/diffractometry-package.Rd diffractometry/man/diffractogram.Rd diffractometry/man/pkdecompint.Rd diffractometry/man/indiumoxide.Rd

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