diffractometry: Baseline Identification and Peak Decomposition for x-Ray Diffractograms
Version 0.1-10

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) .

Package details

AuthorP.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Date of publication2018-03-16 17:24:35 UTC
MaintainerT. Mildenberger <[email protected]>
LicenseGPL (>= 2)
Package repositoryView on CRAN
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diffractometry documentation built on March 18, 2018, 1:53 p.m.