Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).
|Author||P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister|
|Date of publication||2013-12-11 17:15:58|
|Maintainer||T. Mildenberger <email@example.com>|
|License||GPL (>= 2)|
baselinefit: Baseline and peak intervals for diffractometry data
diffractogram: Complete analysis of diffractograms as described in Davies et...
diffractometry-package: Baseline identification and peak decomposition for x-ray...
indiumoxide: Diffractogram of Indium oxide doped with tin
pkdecomp: Decomposition of peaks for the whole data set
pkdecompint: Decomposition of peaks in an interval