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diffractometry: Baseline Identification and Peak Decomposition for x-Ray Diffractograms
Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) <doi:10.1214/08-AOAS181>.
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Package details |
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| Author | P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister |
| Maintainer | T. Mildenberger <mild@zhaw.ch> |
| License | GPL (>= 2) |
| Version | 0.1-10 |
| Package repository | View on CRAN |
| Installation |
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