diffractometry: Baseline Identification and Peak Decomposition for x-Ray Diffractograms

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) <doi:10.1214/08-AOAS181>.

Package details

AuthorP.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
MaintainerT. Mildenberger <[email protected]>
LicenseGPL (>= 2)
Package repositoryView on CRAN
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diffractometry documentation built on March 18, 2018, 1:53 p.m.