diffractometry: Baseline identification and peak decomposition for x-ray diffractograms
Version 0.1-8

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).

Package details

AuthorP.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Date of publication2013-12-11 17:15:58
MaintainerT. Mildenberger <[email protected]>
LicenseGPL (>= 2)
Version0.1-8
Package repositoryView on CRAN
Installation Install the latest version of this package by entering the following in R:
install.packages("diffractometry")

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diffractometry documentation built on May 29, 2017, 7:20 p.m.