indiumoxide: Diffractogram of Indium oxide doped with tin
In diffractometry: Baseline Identification and Peak Decomposition for x-Ray Diffractograms
Description
Usage
Details
Author(s)
References
Description
Example of a diffractogram used in Davies et al. (2008)
Usage
1
Details
The diffractogram was taken on a thin film of In_2 O_3 :Sn,
i.e. indium oxide doped with tin. This material is usually called ITO
(indium-tin-oxide).
It has a good electrical conductivity and is transparent in the visible wave
length region.
The first column of the matrix contains the angles of diffraction, the second column contains the corresponding photon counts.
Author(s)
D. Mergel
References
P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008):
"Residual based localization and quantification of peaks in x-ray diffractograms",
Annals of Applied Statistics, Vol. 2, No. 3, 861-886..
http://www.statistik.tu-dortmund.de/fileadmin/user_upload/Lehrstuehle/MSind/Publikationen/2008/2008_-_Davies_Gather_Meise_Mergel_Mildenberger_-_Residual_based_localization_and_quantification_of_peaks_in_x-ray_diffractograms.pdf
diffractometry documentation built on March 18, 2018, 1:53 p.m.
R Package Documentation
Browse R Packages
We want your feedback!
Note that we can't provide technical support on individual packages. You should contact the package authors for that.
Description Usage Details Author(s) References
Description
Example of a diffractogram used in Davies et al. (2008)
Usage
1 |
Details
The diffractogram was taken on a thin film of In_2 O_3 :Sn, i.e. indium oxide doped with tin. This material is usually called ITO (indium-tin-oxide). It has a good electrical conductivity and is transparent in the visible wave length region. The first column of the matrix contains the angles of diffraction, the second column contains the corresponding photon counts.
Author(s)
D. Mergel
References
P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008): "Residual based localization and quantification of peaks in x-ray diffractograms", Annals of Applied Statistics, Vol. 2, No. 3, 861-886.. http://www.statistik.tu-dortmund.de/fileadmin/user_upload/Lehrstuehle/MSind/Publikationen/2008/2008_-_Davies_Gather_Meise_Mergel_Mildenberger_-_Residual_based_localization_and_quantification_of_peaks_in_x-ray_diffractograms.pdf
R Package Documentation
Browse R Packages
We want your feedback!
Note that we can't provide technical support on individual packages. You should contact the package authors for that.
Embedding an R snippet on your website
Add the following code to your website.
For more information on customizing the embed code, read Embedding Snippets.