Description Details Author(s) References See Also
Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies et al. (2008).
Package: | diffractometry |
Type: | Package |
Version: | 0.1-02 |
Date: | 2010-03-05 |
License: | GPL (>= 2) |
The package diffractometry
contains an implementation of the automatic procedure for analysing x-ray diffractograms of thin films introduced in Davies et al. (2008). The function diffractogram
can be used for a complete analysis, while baselinefit
and pkdecomp
perform baseline estimation and peak decomposion separately. The dataset indiumoxide
is the diffractogram used as an example in the article.
P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Maintainer: T. Mildenberger <mildenbe@statistik.tu-dortmund.de>
P.L. Davies, U. Gather, M. Meise, D. Mergel, T. Mildenberger (2008): "Residual based localization and quantification of peaks in x-ray diffractograms", Annals of Applied Statistics, Vol. 2, No. 3, 861-886.. http://www.statistik.tu-dortmund.de/fileadmin/user_upload/Lehrstuehle/MSind/Publikationen/2008/2008_-_Davies_Gather_Meise_Mergel_Mildenberger_-_Residual_based_localization_and_quantification_of_peaks_in_x-ray_diffractograms.pdf
diffractogram
, baselinefit
, pkdecomp
Add the following code to your website.
For more information on customizing the embed code, read Embedding Snippets.