Description Usage Arguments Value References See Also Examples
View source: R/ts_anom_detection.R
A technique for detecting anomalies in seasonal univariate time series where the input is a series of <timestamp, count> pairs.
1 2 3 4 5 6 7 8 9 | AnomalyDetectionTs(x, max_anoms = 0.1, direction = "pos", alpha = 0.05,
only_last = NULL, threshold = "None", e_value = FALSE,
longterm = FALSE, piecewise_median_period_weeks = 2, verbose = FALSE,
na.rm = FALSE)
ad_ts(x, max_anoms = 0.1, direction = "pos", alpha = 0.05,
only_last = NULL, threshold = "None", e_value = FALSE,
longterm = FALSE, piecewise_median_period_weeks = 2, verbose = FALSE,
na.rm = FALSE)
|
x |
Time series as a two column data frame where the first column consists of the timestamps and the second column consists of the observations. |
max_anoms |
Maximum number of anomalies that S-H-ESD will detect as a percentage of the data. |
direction |
Directionality of the anomalies to be detected. One of:
|
alpha |
The level of statistical significance with which to accept or reject anomalies. |
only_last |
Find and report anomalies only within the last day or hr in the time seriess.
One of |
threshold |
Only report positive going anoms above the threshold specified. One of:
|
e_value |
Add an additional column to the anoms output containing the expected value. |
longterm |
Increase anom detection efficacy for time series that are greater than a month. See 'Details“ below. |
piecewise_median_period_weeks |
The piecewise median time window as described in Vallis, Hochenbaum, and Kejariwal (2014). Defaults to 2. |
verbose |
Enable debug messages |
na.rm |
Remove any NAs in timestamps.(default: |
The returned value is a data frame containing timestamps, values, and optionally expected values.
Vallis, O., Hochenbaum, J. and Kejariwal, A., (2014) "A Novel Technique for Long-Term Anomaly Detection in the Cloud", 6th USENIX, Philadelphia, PA. (https://www.usenix.org/system/files/conference/hotcloud14/hotcloud14-vallis.pdf)
Rosner, B., (May 1983), "Percentage Points for a Generalized ESD Many-Outlier Procedure", Technometrics, 25(2), pp. 165-172. (https://www.jstor.org/stable/1268549)
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