Description Usage Arguments Value References See Also Examples
View source: R/vec_anom_detection.R
A technique for detecting anomalies in seasonal univariate time series where the input is a series of observations.
1 2 3 4 5 6 7 | AnomalyDetectionVec(x, max_anoms = 0.1, direction = "pos", alpha = 0.05,
period = NULL, only_last = FALSE, threshold = "None", e_value = FALSE,
longterm_period = NULL, verbose = FALSE)
ad_vec(x, max_anoms = 0.1, direction = "pos", alpha = 0.05,
period = NULL, only_last = FALSE, threshold = "None", e_value = FALSE,
longterm_period = NULL, verbose = FALSE)
|
x |
Time series as a column data frame, list, or vector, where the column consists of the observations. |
max_anoms |
Maximum number of anomalies that S-H-ESD will detect as a percentage of the data. |
direction |
Directionality of the anomalies to be detected. One of:
|
alpha |
The level of statistical significance with which to accept or reject anomalies. |
period |
Defines the number of observations in a single period, and used during seasonal decomposition. |
only_last |
Find and report anomalies only within the last period in the time series. |
threshold |
Only report positive going anoms above the threshold specified. One of:
|
e_value |
Add an additional column to the anoms output containing the expected value. |
longterm_period |
Defines the number of observations for which the trend can be considered flat. The value should be an integer multiple of the number of observations in a single period. This increases anom detection efficacy for time series that are greater than a month. |
verbose |
Enable debug messages |
The returned value is a list with the following components.
Data frame containing index, values, and optionally expected values.
Vallis, O., Hochenbaum, J. and Kejariwal, A., (2014) "A Novel Technique for Long-Term Anomaly Detection in the Cloud", 6th USENIX, Philadelphia, PA. (https://www.usenix.org/system/files/conference/hotcloud14/hotcloud14-vallis.pdf)
Rosner, B., (May 1983), "Percentage Points for a Generalized ESD Many-Outlier Procedure", Technometrics, 25(2), pp. 165-172. (https://www.jstor.org/stable/1268549)
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