ci.syn: Upper Clopper-Pearson confidence limits under chip synergies

In AdvBinomApps: Upper Clopper-Pearson Confidence Limits for Burn-in Studies under Additional Available Information

Description

Function to compute upper Clopper-Pearson confidence limits of failure probabilities on the basis of burn-in studies for each subset of a chip. Optionally, the required number of additional inspections for reaching a predefined target failure probability is returned.

Usage

ci.syn(k, n, alpha = 0.1, p.target = 1, tol = 1e-10)

Arguments

k	vector of numbers of failures for each subset.
n	vector of numbers of inspections for each subset.
alpha	alpha-level (1-alpha confidence level, default: 0.1).
p.target	target failure probability (optional).
tol	tolerance of uniroot-function used for computing p.hat (default: 1e-10).

Value

p.hat	upper Clopper-Pearson confidence limit of the failure probability of the assembled devices.
n.add	required number of additional inspections of each subset for reaching p.target.

Author(s)

Daniel Kurz, Horst Lewitschnig

Maintainer: Horst Lewitschnig [e-mail]

References

D. Kurz, H. Lewitschnig and J. Pilz: Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Resubmitted to: Journal of Applied Statistics, 2015.

See Also

phi.syn phi.syn.cm ci.syn.cm

Examples

k<-c(0,1)
n<-c(110000,330000)
ci.syn(k,n,0.1,20e-06)

k<-c(1,0,1,5)
n<-c(330000,240000,240000,400000)
ci.syn(k,n,0.1,20e-06)

AdvBinomApps documentation built on May 2, 2019, 3:29 p.m.