Description Usage Arguments Value Author(s) References See Also Examples
Function to compute probability of having a certain number of failures out of min(n)
devices, which are randomly assembled out of a certain number of chip subsets.
1 | phi.syn(k, n)
|
k |
vector of numbers of failures for each subset. |
n |
vector of numbers of inspections for each subset. |
phi |
data frame with possible numbers of failures (out of |
Daniel Kurz, Horst Lewitschnig
Maintainer: Horst Lewitschnig horst.lewitschnig@infineon.com
D. Kurz, H. Lewitschnig and J. Pilz: Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Resubmitted to: Journal of Applied Statistics, 2015.
1 2 3 4 5 6 7 |
Add the following code to your website.
For more information on customizing the embed code, read Embedding Snippets.