Description Usage Arguments Value Author(s) References See Also Examples
Function to scale the numbers of failures in burn-in studies of differently sized reference products down to the greatest common chip size of the products and to merge the downscaled information.
1 | phi.mult.ref(k, n, A.ref, prec = 2, tailcut = 1e-08)
|
k |
vector of total numbers of failures for each reference product. |
n |
vector of numbers of inspected devices for each reference product. |
A.ref |
vector of chip sizes for each reference product (in mm^2). |
prec |
precision for greatest common divisor is 10^- |
tailcut |
probabilities for scaled failures smaller than |
phi |
data frame with possible numbers of failures |
A.gcd |
greatest common divisor of the sizes of the reference products. |
Daniel Kurz, Horst Lewitschnig
Maintainer: Horst Lewitschnig horst.lewitschnig@infineon.com
D. Kurz, H. Lewitschnig and J. Pilz: Failure Probability Estimation with Differently Sized Reference Products for Semiconductor Burn-in Studies. Applied Stochastic Models in Business and Industry, 31(5): 732-744, 2015. DOI: 10.1002/asmb.2100.
ci.mult.ref
phi.mult.ref.cm
ci.mult.ref.cm
1 2 3 4 5 6 7 8 9 10 11 12 13 14 | k<-c(1,2)
n<-c(10,15)
A.ref<-c(2,3)
phi.mult.ref(k,n,A.ref)
k<-c(1,1)
n<-c(110000,220000)
A.ref<-c(5.21,10.71)
phi.mult.ref(k,n,A.ref)
k<-c(1,2,3,4)
n<-c(10,15,20,30)
A.ref<-c(1,2,3,4)
phi.mult.ref(k,n,A.ref)
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