Provides classes and calculation and plotting functions for metrology applications, including measurement uncertainty estimation and inter-laboratory metrology comparison studies.
|Author||Stephen L R Ellison <email@example.com>.|
|Date of publication||2016-11-02 17:52:16|
|Maintainer||Stephen L R Ellison <firstname.lastname@example.org>|
|License||GPL (>= 2)|
|Package repository||View on CRAN|
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