Provides classes and calculation and plotting functions for metrology applications, including measurement uncertainty estimation and inter-laboratory metrology comparison studies.
|Author||Stephen L R Ellison <[email protected]>.|
|Date of publication||2018-09-10 08:30:03 UTC|
|Maintainer||Stephen L R Ellison <[email protected]>|
|License||GPL (>= 2)|
|Package repository||View on CRAN|
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