ar_FASTER: FASTER EEG artefact rejection

In craddm/eegUtils: Utilities for Electroencephalographic (EEG) Analysis

FASTER EEG artefact rejection

Description

An implementation of the FASTER artefact rejection method for EEG by Nolan, Whelan & Reilly (2010) FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.

Usage

ar_FASTER(data, ...)

## S3 method for class 'eeg_epochs'
ar_FASTER(
  data,
  exclude = NULL,
  test_chans = TRUE,
  test_epochs = TRUE,
  test_cine = TRUE,
  ...
)

## S3 method for class 'eeg_group'
ar_FASTER(
  data,
  exclude = NULL,
  test_chans = TRUE,
  test_epochs = TRUE,
  test_cine = TRUE,
  EOG = NULL,
  ...
)

eeg_FASTER(data, ...)

Arguments

data	An object of class eeg_epochs
...	Parameters passed to FASTER
exclude	Channels to be ignored by FASTER.
test_chans	Logical. Run tests of global channel statistics
test_epochs	Logical. Run tests of globally bad epochs.
test_cine	Logical. Run tests for locally bad channels within epochs.
EOG	names of EOG channels to be used when computed maximum EOG values.

Value

An eeg_epochs object with artefact correction applied.

Methods (by class)

• eeg_epochs: Run FASTER on eeg_epochs

• eeg_group: Run FASTER on eeg_group objects

Author(s)

Matt Craddock [e-mail]

References

Nolan, Whelan & Reilly (2010). FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.

Examples

ar_FASTER(demo_epochs)

craddm/eegUtils documentation built on March 24, 2022, 9:17 a.m.