ELECFAIL | R Documentation |
50 failure times of an electronic device.
data(ELECFAIL)
Kenett, R. and Zacks, S. (1998) Modern Industrial Statistics: The Design and Control of Quality and Reliability. Duxbury Press.
data(ELECFAIL) hist(ELECFAIL)
Add the following code to your website.
For more information on customizing the embed code, read Embedding Snippets.