devicea: Temperature-Accelerated Life Test

In Auburngrads/SMRD.data: Statistical Methods For Reliability Data - Datasets

Description

Hooper and Amster analyze the temperature-accelerated life test data on an unidentified device. Meeker and Escobar refer to this device as "Device A". The purpose of the experiment was to determine if "Device A" would meet a failure rate objective through 10,000 hours and 30,000 hours at an operating ambient temperature of 10 degrees celsius. Device samples were tested for up to 5000 hours at four separate temperatures.

Format

A data.frame with 37 rows and 4 variables:

[, 1]	hours	Accumulated time at event	Numeric
[, 2]	event	Event observed at hours (failure/right-censored)	Categoric
[, 3]	count	Number of events observed at hours	Numeric
[, 4]	celsius	Temperature applied to the device during testing	Numeric

Source

Hoopers, J. H. and Amster, S. J. (1990), Analysis and presentation of reliability data, in Handbook of Statistical Methods for Engineers and Scientists, McGraw-Hill, New York. Harrison M. Wadsworth, Editor.

Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, New York, NY; John Wiley & Sons.

See Also

Other data-done: alloya, at7987, bearingcage, berkson20, bleed, ceramicbearing, cirpack6, comptime, computerlab, cylinder, deviceb, devicec, deviceg, fan, gaaslaser, grampus, grids1, halfbeak, heatexchanger, lfp1370, lfptrun100, lzbearing, metalwear, mylarsub, nicdbattery, piccioto, printedcircuitboard, resistor2, resistor, superalloy, tantalum, turbine, v7tube, valveseat, zelencap

Auburngrads/SMRD.data documentation built on May 13, 2019, 10:02 a.m.