deviceg: Field Tracking Study with Multiple Failure Modes

In Auburngrads/SMRD.data: Statistical Methods For Reliability Data - Datasets

Description

Thirty (30) samples of a device that was part of a power generation system were tested as part of a field tracking study for up to 300 thousand cycles. The devices under test were installed in typical service environments and at the occurence of a failure, the observed number of cycles and the type of failure were recorded. Surge failures, which predominated early in the device life-cycle, were caused by an accumulation of randomly occurring damage from power-line voltage spikes during electric storms resulting in failure of a particular unprotected electronic component. Wearout failures resulted from normal product wear and began to appear after 100 thousand cycles of use.

Format

A data.frame with 30 rows and 2 variables:

[, 1]	kilocycles	Accumulated cycles at failure (in thousands)	Numeric
[, 2]	mode	Failure mode observed at kcycles (Wearout/Surge/Suspension)	Categoric

Source

Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, New York, NY; John Wiley & Sons.

See Also

Other data-done: alloya, at7987, bearingcage, berkson20, bleed, ceramicbearing, cirpack6, comptime, computerlab, cylinder, devicea, deviceb, devicec, fan, gaaslaser, grampus, grids1, halfbeak, heatexchanger, lfp1370, lfptrun100, lzbearing, metalwear, mylarsub, nicdbattery, piccioto, printedcircuitboard, resistor2, resistor, superalloy, tantalum, turbine, v7tube, valveseat, zelencap

Auburngrads/SMRD.data documentation built on May 13, 2019, 10:02 a.m.