tantalum: Electrolytic Capacitor Accelerated Life Test

In Auburngrads/SMRD.data: Statistical Methods For Reliability Data - Datasets

Description

Singpurwalla, Castellino, and Goldschen present temperature/voltage accelerated life test data on tantalum electrolytic capacitors. The tests were conducted at temperature/voltage combinations that were nonrectangular and with unequal allocations of units.

Format

A data.frame with 48 rows and 5 variables:

[, 1]	hours	Accumulated time at event	Numeric
[, 2]	event	Event observed at hours (failure/right-censored)	Categoric
[, 3]	count	Number of events observed at hours	Numeric
[, 4]	volts	Voltage applied to the unit	Numeric
[, 5]	celsius	Temperature applied to the unit	Numeric

Source

Singpurwalla, N. D., Castellino, V. C., and Goldschen, D. Y. (1975), Inference from accelerated life tests using Eyring type re-parameterizations, Naval Research Logistics Quarterly, 22, 289-296.

See Also

Other data-done: alloya, at7987, bearingcage, berkson20, bleed, ceramicbearing, cirpack6, comptime, computerlab, cylinder, devicea, deviceb, devicec, deviceg, fan, gaaslaser, grampus, grids1, halfbeak, heatexchanger, lfp1370, lfptrun100, lzbearing, metalwear, mylarsub, nicdbattery, piccioto, printedcircuitboard, resistor2, resistor, superalloy, turbine, v7tube, valveseat, zelencap

Auburngrads/SMRD.data documentation built on May 13, 2019, 10:02 a.m.