gaaslaser: Gallium-Arsenic Laser Degradation Test

In Auburngrads/SMRD.data: Statistical Methods For Reliability Data - Datasets

Description

Over the life of some lasers devices, degradation causes a decrease in light output. In this test, a feedback mechanism was used to maintain a constant light output by increasing the operating current. Fifteen GaAs laser devices were tested at an elevated temperature of 80^o C to accelerate the degradation process. The operating current was measured in 250-hour intervals and the data were recorded as the percent increase in current compared to the initial operating current measured when the test began. A device was considered to have failed if the percent increase reached 10%.

Format

A data.frame with 255 rows and 3 variables:

[, 1]	increase	Percent increase in observed operating current	Numeric
[, 2]	unit	Unit designator code	Categoric
[, 3]	hours	Accumulated time when increase was measured	Numeric

Source

Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, New York, NY; John Wiley & Sons.

See Also

Other data-done: alloya, at7987, bearingcage, berkson20, bleed, ceramicbearing, cirpack6, comptime, computerlab, cylinder, devicea, deviceb, devicec, deviceg, fan, grampus, grids1, halfbeak, heatexchanger, lfp1370, lfptrun100, lzbearing, metalwear, mylarsub, nicdbattery, piccioto, printedcircuitboard, resistor2, resistor, superalloy, tantalum, turbine, v7tube, valveseat, zelencap

Auburngrads/SMRD.data documentation built on May 13, 2019, 10:02 a.m.